Genetic Programming Bibliography entries for Tom Arbuckle
up to index
Created by W.Langdon from
gp-bibliography.bib Revision:1.8120
GP coauthors/coeditors:
Damien Hogan,
Conor Ryan,
Genetic Programming Articles by Tom Arbuckle
-
Tom Arbuckle and Damien Hogan and Conor Ryan.
Learning predictors for flash memory endurance: a comparative study of alternative classification methods.
International Journal of Computational Intelligence Studies, 3(1):18-39, 2014.
details
Genetic Programming conference papers by Tom Arbuckle
-
Damien Hogan and Tom Arbuckle and Conor Ryan.
How Early and with How Little Data? Using Genetic Programing to Evolve Endurance Classifiers for MLC NAND Flash Memory. In
Krzysztof Krawiec and Alberto Moraglio and Ting Hu and A. Sima Uyar and Bin Hu editors,
Proceedings of the 16th European Conference on Genetic Programming, EuroGP 2013, volume 7831, pages 253-264, Vienna, Austria, 2013. Springer Verlag.
details
-
Damien Hogan and Tom Arbuckle and Conor Ryan.
Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application. In
Christian Blum and Enrique Alba and Anne Auger and Jaume Bacardit and Josh Bongard and Juergen Branke and Nicolas Bredeche and Dimo Brockhoff and Francisco Chicano and Alan Dorin and Rene Doursat and Aniko Ekart and Tobias Friedrich and Mario Giacobini and Mark Harman and Hitoshi Iba and Christian Igel and Thomas Jansen and Tim Kovacs and Taras Kowaliw and Manuel Lopez-Ibanez and Jose A. Lozano and Gabriel Luque and John McCall and Alberto Moraglio and Alison Motsinger-Reif and Frank Neumann and Gabriela Ochoa and Gustavo Olague and Yew-Soon Ong and Michael E. Palmer and Gisele Lobo Pappa and Konstantinos E. Parsopoulos and Thomas Schmickl and Stephen L. Smith and Christine Solnon and Thomas Stuetzle and El-Ghazali Talbi and Daniel Tauritz and Leonardo Vanneschi editors,
GECCO '13: Proceeding of the fifteenth annual conference on Genetic and evolutionary computation conference, pages 1285-1292, Amsterdam, The Netherlands, 2013. ACM.
details
-
Damien Hogan and Tom Arbuckle and Conor Ryan.
Evolving a storage block endurance classifier for Flash memory: A trial implementation. In
11th IEEE International Conference on Cybernetic Intelligent Systems (CIS 2012), pages 12-17, Limerick, 2012.
details