Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application

Created by W.Langdon from gp-bibliography.bib Revision:1.8010

@InProceedings{Hogan:2013:GECCO,

• author = "Damien Hogan and Tom Arbuckle and Conor Ryan",
• title = "Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application",
• booktitle = "GECCO '13: Proceeding of the fifteenth annual conference on Genetic and evolutionary computation conference",
• year = "2013",
• editor = "Christian Blum and Enrique Alba and Anne Auger and Jaume Bacardit and Josh Bongard and Juergen Branke and Nicolas Bredeche and Dimo Brockhoff and Francisco Chicano and Alan Dorin and Rene Doursat and Aniko Ekart and Tobias Friedrich and Mario Giacobini and Mark Harman and Hitoshi Iba and Christian Igel and Thomas Jansen and Tim Kovacs and Taras Kowaliw and Manuel Lopez-Ibanez and Jose A. Lozano and Gabriel Luque and John McCall and Alberto Moraglio and Alison Motsinger-Reif and Frank Neumann and Gabriela Ochoa and Gustavo Olague and Yew-Soon Ong and Michael E. Palmer and Gisele Lobo Pappa and Konstantinos E. Parsopoulos and Thomas Schmickl and Stephen L. Smith and Christine Solnon and Thomas Stuetzle and El-Ghazali Talbi and Daniel Tauritz and Leonardo Vanneschi",
• isbn13 = "978-1-4503-1963-8",
• pages = "1285--1292",
• keywords = "genetic algorithms, genetic programming",
• month = "6-10 " # jul,
• organisation = "SIGEVO",
• address = "Amsterdam, The Netherlands",
• DOI = "doi:10.1145/2463372.2463537",
• publisher = "ACM",
• publisher_address = "New York, NY, USA",
• abstract = "NAND Flash memory is a multi-billion dollar industry which is projected to continue to show significant growth until at least 2017. Devices such as smart-phones, tablets and Solid State Drives use NAND Flash since it has numerous advantages over Hard Disk Drives including better performance, lower power consumption, and lower weight. However, storage locations within Flash devices have a limited working lifetime, as they slowly degrade through use, eventually becoming unreliable and failing. The number of times a location can be programmed is termed its endurance, and can vary significantly, even between locations within the same device. There is currently no technique available to predict endurance, resulting in manufacturers placing extremely conservative specifications on their Flash devices. We perform symbolic regression using Genetic Programming to estimate the endurance of storage locations, based only on the duration of program and erase operations recorded from them. We show that the quality of estimations for a device can be refined and improved as the device continues to be used, and investigate a number of different approaches to deal with the significant variations in the endurance of storage locations. Results show this technique's huge potential for real-world application.",
• notes = "Also known as \cite{2463537} GECCO-2013 A joint meeting of the twenty second international conference on genetic algorithms (ICGA-2013) and the eighteenth annual genetic programming conference (GP-2013)",

}

Genetic Programming entries for Damien Hogan Tom Arbuckle Conor Ryan

Citations