Genetic Programming Bibliography entries for Nicola Femia
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GP coauthors/coeditors:
Alberto Delgado,
Giulia Di Capua,
Kateryna Stoyka,
Lixin Shi,
Antonio Maffucci,
Salvatore Ventre,
Pedro Alou,
Jesus A Oliver,
Jose A Cobos,
Nunzio Oliva,
Filippo Milano,
Carmine Bourelly,
Francesco Porpora,
Mario Migliaro,
Gennaro Di Mambro,
Fabio Villone,
Vincenzo Cirimele,
Fabio Freschi,
Mario Molinara,
Francesco R Fontanella,
Claudio De Stefano,
Antonio Della Cioppa,
Cristiano Pastore,
Davide Toledo,
Ricieri Akihito Pessinatti Ohashi,
Genetic Programming Articles by Nicola Femia
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Alberto Delgado and Giulia Di Capua and Kateryna Stoyka and Lixin Shi and Nicola Femia and Antonio Maffucci and Salvatore Ventre and Pedro Alou and Jesus A. Oliver and Jose A. Cobos.
Self and Mutual Inductance Behavioral Modeling of Rectangular IPT Coils with Air Gap and Ferrite Core Plates.
IEEE Access, 10:7476-7488, 2022.
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Giulia Di Capua and Antonio Maffucci and Kateryna Stoyka and Gennaro Di Mambro and Salvatore Ventre and Vincenzo Cirimele and Fabio Freschi and Fabio Villone and Nicola Femia.
Analysis of Dynamic Wireless Power Transfer Systems Based on Behavioral Modeling of Mutual Inductance.
Sustainability, 13(5) 2021.
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Kateryna Stoyka and Gennaro Di Mambro and Nicola Femia and Antonio Maffucci and Salvatore Ventre and Fabio Villone.
Behavioral modeling of Wireless Power Transfer System coils.
Mathematics and Computers in Simulation, 2020.
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Giulia Di Capua and Nicola Femia and Kateryna Stoyka and Gennaro Di Mambro and Antonio Maffucci and Salvatore Ventre and Fabio Villone.
Mutual Inductance Behavioral Modeling for Wireless Power Transfer System Coils.
IEEE Transactions on Industrial Electronics, 2020.
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Kateryna Stoyka and Giulia Di Capua and Nicola Femia.
A Novel AC Power Loss Model for Ferrite Power Inductors.
IEEE Transactions on Power Electronics, 34(3):2680-2692, 2019.
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Genetic Programming conference papers by Nicola Femia
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G. Di Capua and N. Oliva and F. Milano and C. Bourelly and F. Porpora and A. Maffucci and N. Femia.
A Behavioral Model for Lithium Batteries based on Genetic Programming. In
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023.
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Giulia Di Capua and Mario Molinara and Francesco Fontanella and Claudio De Stefano and Nunzio Oliva and Nicola Femia.
Modeling of Ferrite Inductors Power Loss Based on Genetic Programming and Neural Networks. In
Claudio De Stefano and Francesco Fontanella and Leonardo Vanneschi editors,
WIVACE 2022, XVI International Workshop on Artificial Life and Evolutionary Computation, volume 1780, pages 245-253, Gaeta (LT), Italy, 2022. Springer.
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K. Stoyka and G. Di Capua and G. Di Mambro and N. Femia and F. Freschi and A. Maffucci and S. Ventre.
Behavioral Models for the Analysis of Dynamic Wireless Charging Systems for Electrical Vehicles. In
2020 IEEE International Symposium on Circuits and Systems (ISCAS), 2020.
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Kateryna Stoyka and Ricieri Akihito Pessinatti Ohashi and Nicola Femia.
Behavioral Switching Loss Modeling of Inverter Modules. In
2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2018.
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Giulia Di Capua and Nicola Femia and Kateryna Stoyka.
Loss Behavioral Modeling for Ferrite Inductors. In
2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2018.
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N. Femia and M. Migliaro and C. Pastore and D. Toledo.
In-system IGBT power loss behavioral modeling. In
2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016.
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Nicola Femia and Mario Migliaro and Antonio Della Cioppa.
A Genetic Programming approach to modeling power losses of Insulate Gate Bipolar Transistors. In
Yew-Soon Ong editor,
Proceedings of 2016 IEEE Congress on Evolutionary Computation (CEC 2016), pages 4705-4712, Vancouver, 2016. IEEE Press.
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Giulia Di Capua and Nicola Femia and Mario Migliaro and Kateryna Stoyka.
Genetic programming approach for identification of ferrite inductors power loss models. In
IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, pages 1112-1117, 2016.
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